Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification
Chia-Yu Hsu, Ju-Chien Chien
Topics & Concepts
Artificial intelligenceBoosting (machine learning)Gradient boostingComputer scienceConvolutional neural networkArtificial neural networkPattern recognition (psychology)Random forestData miningMachine learningIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques