Measuring liquid film thickness based on the brightness level of the fluorescence: Methodical overview
Andrey Cherdantsev, А. В. Бобылев, V. V. Guzanov, A Z Kvon, S. M. Kharlamov
Topics & Concepts
Materials scienceOpticsBrightnessCurvatureCalibrationRay tracing (physics)FluorescenceLaserTracingComputer sciencePhysicsMathematicsOperating systemGeometryQuantum mechanicsFluid Dynamics and MixingPlant Water Relations and Carbon DynamicsFluid Dynamics and Heat Transfer