Ultra-compact displacement and vibration sensor with a sub-nanometric resolution based on Talbot effect of optical microgratings
Chenguang Xin, Zhiyong Yang, Jie Qi, Qianqi Niu, xiaochen ma, Changjiang Fan, Mengwei Li
Abstract
Based on Talbot effect of optical microgratings, we report an ultra-compact sensor for displacement and vibration measurement with resolution down to sub-nanometer level. With no need of optical components such as reflectors, splitters, polarizers, and wave plates, the proposed sensor based on a common-path structure shows a high compactness. Using gratings with period of 3 µm, displacement measurement within a range of 1 mm is demonstrated experimentally. Associated with an interpolation circuit with subdividing factor of 4096, a resolution of 0.73 nm is obtained. The experimental results also show the ability for the sensor to detect in-plane vibration with frequency below 900 Hz. With a sub-nanometer resolution and an ultra-compact structure, the miniature sensor shows potential in applications such as high-precision machinery manufacturing and semiconductor processing.