Optimized deep networks for the classification of nanoparticles in scanning electron microscopy imaging
Ghada Dahy, Mona Soliman, Heba Alshater, Adam Słowik, Aboul Ella Hassanien
Topics & Concepts
Artificial intelligenceSupport vector machineComputer scienceFeature selectionPattern recognition (psychology)Feature extractionPreprocessorClassifier (UML)NanoparticleScanning electron microscopeNanoparticle tracking analysisMachine learningMaterials scienceNanotechnologyChemistrymicroRNABiochemistryComposite materialGeneMicrovesiclesMachine Learning in Materials ScienceElectron and X-Ray Spectroscopy TechniquesIndustrial Vision Systems and Defect Detection