Reliability analysis of systems with n-stage shock process and m-stage degradation
Dong Xu, Xujie Jia, Xueying Song
Topics & Concepts
Reliability (semiconductor)Reliability engineeringDegradation (telecommunications)Computer scienceProcess (computing)Monte Carlo methodShock (circulatory)Markov processStochastic processEngineeringMathematicsStatisticsPhysicsOperating systemTelecommunicationsInternal medicineQuantum mechanicsPower (physics)MedicineReliability and Maintenance OptimizationRisk and Safety AnalysisSoftware Reliability and Analysis Research