Research of single-event burnout and hardened GaN MISFET with embedded PN junction
Xin-Xing Fei, Ying Wang, Xin Luo, Meng-Tian Bao, Chenghao Yu, Xingji Li
Topics & Concepts
MISFETMaterials scienceOptoelectronicsElectrical engineeringField-effect transistorVoltageTransistorEngineeringRadiation Effects in ElectronicsAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devices