Litcius/Paper detail

Few-shot fault identification of complex equipment via metric-based features capture GAN combining prior knowledge-augmented strategy

Shusen Dou, Fudong Li, Yuanhong Chang, Jinglong Chen, Weiguang Zheng, Aimin Li

2023Journal of Manufacturing Systems16 citationsDOI

Topics & Concepts

DiscriminatorComputer scienceFault (geology)Classifier (UML)Metric (unit)Data miningArtificial intelligenceMachine learningEngineeringGeologyTelecommunicationsDetectorOperations managementSeismologyMachine Fault Diagnosis TechniquesAnomaly Detection Techniques and ApplicationsGear and Bearing Dynamics Analysis
Few-shot fault identification of complex equipment via metric-based features capture GAN combining prior knowledge-augmented strategy | Litcius