Exploring statistical approaches for accessing the reliability of Y2O3-based memristive devices
Dhananjay D. Kumbhar, Sanjay Kumar, Mayank Dubey, Amitesh Kumar, Tukaram D. Dongale, Somanath D. Pawar, Shaibal Mukherjee
Topics & Concepts
Reliability (semiconductor)Computer scienceNanotechnologyReliability engineeringMaterials sciencePhysicsEngineeringQuantum mechanicsPower (physics)Advanced Memory and Neural ComputingNeuroscience and Neural EngineeringNeural dynamics and brain function