Absorption-Dominant mmWave EMI Shielding Films with Ultralow Reflection using Ferromagnetic Resonance Frequency Tunable M-Type Ferrites
Horim Lee, Seung Han Ryu, Suk Jin Kwon, Jae Ryung Choi, Sang‐Bok Lee, Byeongjin Park
Abstract
Although there is a high demand for absorption-dominant electromagnetic interference (EMI) shielding materials for 5G millimeter-wave (mmWave) frequencies, most current shielding materials are based on reflection-dominant conductive materials. While there are few absorption-dominant shielding materials proposed with magnetic materials, their working frequencies are usually limited to under 30 GHz. In this study, a novel multi-band absorption-dominant EMI shielding film with M-type strontium ferrites and a conductive grid is proposed. This film shows ultralow EMI reflection of less than 5% in multiple mmWave frequency bands with sub-millimeter thicknesses, while shielding more than 99.9% of EMI. The ultralow reflection frequency bands are controllable by tuning the ferromagnetic resonance frequency of M-type strontium ferrites and composite layer geometries. Two examples of shielding films with ultralow reflection frequencies, one for 39 and 52 GHz 5G telecommunication bands and the other for 60 and 77 GHz autonomous radar bands, are presented. The remarkably low reflectance and thinness of the proposed films provide an important advancement toward the commercialization of EMI shielding materials for 5G mmWave applications.