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Wavefront correction for adaptive optics with reflected light and deep neural networks

Ivan Vishniakou, Johannes D. Seelig

2020Optics Express23 citationsDOIOpen Access PDF

Abstract

Light scattering and aberrations limit optical microscopy in biological tissue, which motivates the development of adaptive optics techniques. Here, we develop a method for wavefront correction in adaptive optics with reflected light and deep neural networks compatible with an epi-detection configuration. Large datasets of sample aberrations which consist of excitation and detection path aberrations as well as the corresponding reflected focus images are generated. These datasets are used for training deep neural networks. After training, these networks can disentangle and independently correct excitation and detection aberrations based on reflected light images recorded from scattering samples. A similar deep learning approach is also demonstrated with scattering guide stars. The predicted aberration corrections are validated using two photon imaging.

Topics & Concepts

OpticsWavefrontAdaptive opticsPhysicsArtificial neural networkLight scatteringFocus (optics)ScatteringMicroscopyDeformable mirrorComputer scienceLimit (mathematics)Artificial intelligenceOptical aberrationPhotonExcitationStray lightSpatial frequencySpatial light modulatorPhysical opticsForward scatterOptical pathGeometrical opticsWavefront sensorHolographyRayDeep learningPoint spread functionIterative reconstructionSpatial filterRandom lasers and scattering mediaAdvanced X-ray Imaging TechniquesAdvanced Fluorescence Microscopy Techniques