RETRACTED: Optical and electronic properties for As-60 at.% S uniform thickness of thin films: Influence of Se content
Ammar Qasem, M.Y. Hassaan, M.G. Moustafa, Mohamed A.S. Hammam, H. Y. Zahran, I.S. Yahia, E.R. Shaaban
Topics & Concepts
Refractive indexThin filmTransmittanceMaterials scienceDielectricOpticsMolar absorptivityDispersion (optics)Analytical Chemistry (journal)Spectral lineOptoelectronicsChemistryNanotechnologyPhysicsChromatographyAstronomyPhase-change materials and chalcogenidesChalcogenide Semiconductor Thin FilmsCrystal Structures and Properties