Influence of Cu/W interfacial structure on the resistance against harmful helium atoms: A mechanism analysis
Qiuguo Yang, Chao Lu, Yan Han, Xiaohua Chen, Jian Yang, Jihua Huang, Shuhai Chen, Zheng Ye
Topics & Concepts
Mechanism (biology)HeliumMaterials scienceChemistryChemical physicsAtomic physicsPhysicsQuantum mechanicsCopper Interconnects and ReliabilityAdvanced materials and compositesFusion materials and technologies