Stochasticity in ferroelectric memory devices with different bottom electrode crystallinity
Ryun‐Han Koo, Wonjun Shin, Gyuweon Jung, Dongseok Kwon, Dongseok Kwon, Jae‐Joon Kim, Daewoong Kwon, Daewoong Kwon, Jong-Ho Lee
Topics & Concepts
CrystallinityFerroelectricityElectrodeMaterials scienceOptoelectronicsComposite materialChemistryDielectricPhysical chemistryFerroelectric and Negative Capacitance DevicesAdvanced Memory and Neural ComputingSemiconductor materials and devices