A 4-GS/s 10-ENOB 75-mW Ringamp ADC in 16-nm CMOS With Background Monitoring of Distortion
Benjamin Hershberg, Davide Dermit, Barend van Liempd, Ewout Martens, Nereo Markulić, Jorge Lagos, Jan Craninckx
Abstract
A 4× interleaved pipelined ADC for direct-RF sampling applications is presented. It leverages the performance advantages of ring amplifiers to unlock greater architectural freedom. The first pipeline stage MDAC with a “passive-hold” mode eliminates the sub-ADC sampling path and associated problems. A high-speed ringamp topology employs digital bias control, robust common-mode feedback (CMFB), and an elegant self-resetting behavior. An asynchronous, event-driven timing control system improves several aspects of performance and enables fully dynamic power consumption and modular design re-use. A general technique is presented whereby the signal-to-distortion ratio (SDR) of any amplifier in the system can be measured in the background with an analog hardware overhead of only one comparator. In this amplifier-intensive architecture utilizing 36 ringamps, the 4-GS/s ADC fabricated in 16-nm CMOS achieves 62-dB SNDR and 75-dB SFDR at Nyquist, consumes 75 mW (including input buffer), and has a Walden figure of merit (FoM) of 18 fJ/conversion-step and a Schreier FoM of 166 dB, advancing the state of the art in direct-RF sampling ADCs by roughly an order of magnitude.