Bayesian uncertainty evaluation of stitching interferometry for cylindrical surface
Dingfu Chen, Chen Wang, Sergiy Valyukh, Xin Wu, Yingjie Yu
Topics & Concepts
Image stitchingMarkov chain Monte CarloCalibrationMeasurement uncertaintyStandard deviationUncertainty analysisBayesian probabilityMonte Carlo methodAlgorithmMetrologyGibbs samplingComputer scienceInterferometryBayesian inferenceStatisticsMathematicsOpticsArtificial intelligencePhysicsOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesSurface Roughness and Optical Measurements