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A Reconfigurable 4T2R ReRAM Computing In-Memory Macro for Efficient Edge Applications

Yuzong Chen, Lu Lu, Bongjin Kim, Tony Tae-Hyoung Kim

2021IEEE Open Journal of Circuits and Systems29 citationsDOIOpen Access PDF

Abstract

Resistive random access memory (ReRAM)-based computing in-memory (CIM) is a promising solution to overcome the von-Neumann bottleneck in conventional computing architectures. We propose a reconfigurable ReRAM architecture using a novel 4T2R bit-cell that supports non-volatile storage and two types of CIM operations: i) ternary content addressable memory (TCAM) and ii) in-memory dot product (IM-DP) for neural networks. The proposed 4T2R cell occupies a smaller area than prior SRAM-based CIM bit-cells. A 128 × 128 ReRAM macro is designed in 40nm CMOS technology. For TCAM operations, it allows a search word-length of 128 bits. For IM-DP operations, it can compute parallel dot products using binary inputs and ternary weights. The simulated search delay for TCAM operation is 0.92 ns at VDD = 0.9 V and the simulated energy efficiency for IM-DP operation is 223.6 TOPS/W at VDD = 0.7 V. Monte-Carlo simulations show a standard deviation of 4.9% in accumulate operation for IM-DP which corresponds to a classification accuracy of 95.7% on the MNIST dataset and 81.7% on the CIFAR-10 dataset.

Topics & Concepts

Resistive random-access memoryComputer scienceStatic random-access memoryBottleneckIn-Memory ProcessingMNIST databaseParallel computingVon Neumann architectureContent-addressable memoryBlock (permutation group theory)MacroDot productMemory architectureCMOSComputer hardwareBinary numberComputational scienceArtificial neural networkVoltageEmbedded systemElectronic engineeringSearch engineArithmeticArtificial intelligenceOperating systemElectrical engineeringMathematicsEngineeringWeb search queryProgramming languageInformation retrievalGeometryQuery by ExampleAdvanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesMachine Learning and ELM
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