Advanced Mueller matrix ellipsometry: Instrumentation and emerging applications
Xiuguo Chen, Honggang Gu, JiaMin Liu, Chao Chen, Shiyuan Liu
Topics & Concepts
Mueller calculusEllipsometryMatrix (chemical analysis)Instrumentation (computer programming)Characterization (materials science)Computer scienceBroadbandOpticsMaterials scienceNanotechnologyPhysicsThin filmPolarimetryComposite materialOperating systemScatteringOptical Polarization and EllipsometryLeaf Properties and Growth MeasurementSurface Roughness and Optical Measurements