Electron beam and thermal stabilities of MFM-300(M) metal–organic frameworks
Eu-Pin Tien, Guanhai Cao, Yinlin Chen, Nick Clark, Evan Tillotson, Duc-The Ngo, Joseph H. Carter, Stephen P. Thompson, Chiu C. Tang, Christopher S. Allen, Sihai Yang⧫, Martin Schröder, Sarah J. Haigh
Abstract
synchrotron X-ray diffraction at elevated temperature, which revealed critical temperatures for crystal degradation to be 605, 570, 490 and 480 °C for Al, Cr, Ga, and In, respectively. The pore channel diameters contracted by ≈0.5% on desorption of solvent species, but thermal degradation at higher temperatures was isotropic. The observed electron stabilities were found to scale with the relative inertness of the cations and correlate well to the measured lifetime of the materials when used as photocatalysts.
Topics & Concepts
IsostructuralCathode rayMaterials scienceThermalElectronMetalBeam (structure)Work (physics)CrystallographyChemistryCrystal structureMetallurgyPhysicsOpticsThermodynamicsNuclear physicsMetal-Organic Frameworks: Synthesis and ApplicationsMagnetism in coordination complexesBoron and Carbon Nanomaterials Research