Reliability of 2 methods in maxillary transverse deficiency diagnosis
Chunxi Zhang, Xiaoming Tan, Wei Wu, Hong Liu, Yi Liu, Xiao-ru Qu, Dongxu Liu
Topics & Concepts
Transverse planeIntraclass correlationKappaMedicineCohen's kappaReliability (semiconductor)OrthodonticsDentistryReproducibilityMathematicsStatisticsPhysicsRadiologyGeometryQuantum mechanicsPower (physics)Orthodontics and Dentofacial OrthopedicsTemporomandibular Joint DisordersCleft Lip and Palate Research