Litcius/Paper detail

Reliability of 2 methods in maxillary transverse deficiency diagnosis

Chunxi Zhang, Xiaoming Tan, Wei Wu, Hong Liu, Yi Liu, Xiao-ru Qu, Dongxu Liu

2021American Journal of Orthodontics and Dentofacial Orthopedics20 citationsDOI

Topics & Concepts

Transverse planeIntraclass correlationKappaMedicineCohen's kappaReliability (semiconductor)OrthodonticsDentistryReproducibilityMathematicsStatisticsPhysicsRadiologyGeometryQuantum mechanicsPower (physics)Orthodontics and Dentofacial OrthopedicsTemporomandibular Joint DisordersCleft Lip and Palate Research
Reliability of 2 methods in maxillary transverse deficiency diagnosis | Litcius