X-ray optics and beam characterization using random modulation: experiments
Sebastien Berujon, Ruxandra Cojocaru, Pierre Piault, Rafael Celestre, Thomas Roth, Raymond Barrett, Eric Ziegler
Abstract
A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, 284-292] reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics.
Topics & Concepts
WavefrontOpticsMetrologyCharacterization (materials science)Adaptive opticsX-ray opticsPhysicsPhysical opticsInterferometryBeam (structure)SynchrotronComputer scienceHolographyDeformable mirrorSynchrotron radiationIntegrated opticsMaterials scienceGeometrical opticsWavefront sensorLight beamMonte Carlo methodPhase retrievalActive opticsRefractive indexAdvanced X-ray Imaging TechniquesCrystallography and Radiation PhenomenaRadiation Shielding Materials Analysis