A fresh look at computer vision for industrial quality control
Bart De Ketelaere, Niels Wouters, Ioannis Kalfas, Remi Van Belleghem, Wouter Saeys
Abstract
KEY POINTSThis article draws attention to key developments in the field of computer vision for industrial quality control and provides some illustrative examples.
Topics & Concepts
Key (lock)Quality (philosophy)Control (management)Field (mathematics)EngineeringComputer scienceManufacturing engineeringEngineering managementOperations managementArtificial intelligenceComputer securityMathematicsPure mathematicsPhilosophyEpistemologyIndustrial Vision Systems and Defect DetectionSpectroscopy and Chemometric AnalysesRemote-Sensing Image Classification