Turn-around of threshold voltage shift in amorphous InGaZnO TFT under positive bias illumination stress
Juwon Kim, Hyunjin Kim, Jungyeop Oh, Sung‐Yool Choi, Hamin Park
Topics & Concepts
Thin-film transistorThreshold voltageMaterials scienceOptoelectronicsAmorphous solidStress (linguistics)TransistorSubthreshold conductionVoltageElectrical engineeringChemistryNanotechnologyCrystallographyLinguisticsEngineeringLayer (electronics)PhilosophyThin-Film Transistor Technologies