Localization and Mitigation of Loss in Niobium Superconducting Circuits
M. Virginia P. Altoé, Archan Banerjee, Cassidy Berk, Ahmed Hajr, Adam Schwartzberg, Chengyu Song, Mohammed Alghadeer, Shaul Aloni, Michael J. Elowson, John Mark Kreikebaum, Ed Wong, Sinéad M. Griffin, Saleem G. Rao, Alexander Weber‐Bargioni, Andrew M. Minor, David Santiago, Stefano Cabrini, Irfan Siddiqi, D. Frank Ogletree
Abstract
Using selective post-fabrication etching, different ratios of TLS and other resonator losses are associated with the silicon and niobium surface oxides, while the resonator coherent lifetime is increased by a factor of five.
Topics & Concepts
NiobiumEtching (microfabrication)ResonatorSuperconductivityFabricationMaterials scienceSiliconOptoelectronicsElectronic circuitSuperconducting radio frequencyNanotechnologyOpticsElectrical engineeringMetallurgyCondensed matter physicsPhysicsEngineeringLayer (electronics)Particle acceleratorAlternative medicinePathologyMedicineBeam (structure)Quantum and electron transport phenomenaPhysics of Superconductivity and MagnetismAdvancements in Semiconductor Devices and Circuit Design