Linearization and characterization of the Wemple – DiDomenico model of ZnO/Ni/ZnO tri-layer thin films prepared by ALD and DC magnetron sputtering
S.S. Fouad, E. Baradács, M. Nabil, Arvind Kumar Sharma, N. Mehta, Zoltán Erdélyi
Topics & Concepts
Materials scienceCrystalliteBand gapThin filmRefractive indexSputter depositionAttenuation coefficientAtomic layer depositionAnalytical Chemistry (journal)Absorption (acoustics)Molar absorptivitySputteringOptoelectronicsOpticsNanotechnologyComposite materialChemistryMetallurgyPhysicsChromatographyZnO doping and propertiesCopper-based nanomaterials and applicationsGaN-based semiconductor devices and materials