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Resistive random access memory characteristics of NiO thin films with an oxygen-deficient NiO0.95 layer

Yoonho Ahn, Jong Yeog Son

2020Ceramics International30 citationsDOI

Topics & Concepts

Non-blocking I/OResistive random-access memoryMaterials scienceLayer (electronics)Thin filmOxygenSputter depositionOptoelectronicsNickel oxideAnalytical Chemistry (journal)SputteringNanotechnologyOxideVoltageMetallurgyElectrical engineeringChemistryOrganic chemistryEngineeringChromatographyBiochemistryCatalysisAdvanced Memory and Neural ComputingTransition Metal Oxide NanomaterialsFerroelectric and Negative Capacitance Devices
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