Atomic composition changes in bismuth telluride thin films by thermal annealing and estimation of their thermoelectric properties using experimental analyses and first-principles calculations
Susumu Yonezawa, Toshihiro Tabuchi, Masayuki Takashiri
Topics & Concepts
Bismuth tellurideThermoelectric effectMaterials scienceAnnealing (glass)Seebeck coefficientThin filmAnalytical Chemistry (journal)TellurideBismuthSputter depositionSputteringMetallurgyChemistryNanotechnologyThermal conductivityComposite materialThermodynamicsPhysicsChromatographyAdvanced Thermoelectric Materials and DevicesChalcogenide Semiconductor Thin FilmsAdvanced Semiconductor Detectors and Materials