High-performance radiation hardened NMOS only Schmitt Trigger based latch designs
Ambika Prasad Shah, Neha Gupta, Michael Waltl
Topics & Concepts
NMOS logicSchmitt triggerSoft errorTransistorElectronic circuitCMOSPhysicsSingle event upsetElectrical engineeringVoltageRadiationElectronic engineeringComputer scienceOptoelectronicsEngineeringStatic random-access memoryOpticsRadiation Effects in ElectronicsLow-power high-performance VLSI designVLSI and Analog Circuit Testing