Litcius/Paper detail

Fabric defect detection and classification via deep learning-based improved Mask RCNN

G. Revathy, R. Kalaivani

2023Signal Image and Video Processing32 citationsDOI

Topics & Concepts

Artificial intelligencePattern recognition (psychology)Computer scienceDeep learningIndustrial Vision Systems and Defect DetectionManufacturing Process and OptimizationImage and Object Detection Techniques
Fabric defect detection and classification via deep learning-based improved Mask RCNN | Litcius