Correlation analysis of vibration modes in physical vapour deposited Bi<sub>2</sub>Se<sub>3</sub> thin films probed by the Raman mapping technique
Kiryl Niherysh, Jana Andžāne, М. М. Михалик, S. M. Zavadsky, P. L. Dobrokhotov, Ф. Ломбарди, S. L. Prischepa, I. Komissarov, Donāts Erts
Abstract
We propose the evaluation of strain in Bi 2 Se 3 films based on the correlation analysis of in-plane (E2g) and out-of-plane (A21g) Raman mode positions as well as the algorithm of phonon deformation potential calculation for biaxial in-plane strain.
Topics & Concepts
Raman spectroscopyMaterials scienceGrapheneAmorphous solidQuartzThin filmChemical vapor depositionSubstrate (aquarium)PhononHydrostatic equilibriumComposite materialOpticsCondensed matter physicsOptoelectronicsCrystallographyNanotechnologyChemistryGeologyOceanographyPhysicsQuantum mechanicsTopological Materials and Phenomena2D Materials and ApplicationsAdvanced Thermoelectric Materials and Devices