A novel method for in-process inspection of lattice structures via in-situ layerwise imaging
Bianca Maria Colosimo, Federica Garghetti, Luca Pagani, Marco Grasso
Topics & Concepts
In situMetrologySegmentationLattice (music)Computer scienceGround truthRepresentation (politics)Process (computing)Artificial intelligenceAlgorithmMaterials scienceMathematicsPhysicsStatisticsAcousticsLawPoliticsMeteorologyPolitical scienceOperating systemIndustrial Vision Systems and Defect DetectionAdditive Manufacturing and 3D Printing TechnologiesOptical measurement and interference techniques