A two-stage data-driven approach to remaining useful life prediction via long short-term memory networks
Huixin Zhang, Xiaopeng Xi, Rong Pan
Topics & Concepts
Artificial neural networkLong short term memoryProcess (computing)Computer scienceSet (abstract data type)Term (time)Machine learningDegradation (telecommunications)Artificial intelligencePredictive maintenanceReliability engineeringNonlinear systemData miningEngineeringRecurrent neural networkPhysicsTelecommunicationsQuantum mechanicsProgramming languageOperating systemMachine Fault Diagnosis TechniquesReliability and Maintenance OptimizationNon-Destructive Testing Techniques