Non-parametric semi-supervised chiller fault diagnosis via variational compressor under severe few labeled samples
Huazheng Han, Xuejin Gao, Huayun Han, Huihui Gao, Yongsheng Qi, Kexin Jiang
Topics & Concepts
Computer scienceGas compressorParametric statisticsFault (geology)ChillerStatisticsThermodynamicsMathematicsPhysicsSeismologyGeologyIndustrial Vision Systems and Defect DetectionImage Processing Techniques and ApplicationsAnomaly Detection Techniques and Applications