FN-Net: A lightweight CNN-based architecture for fabric defect detection with adaptive threshold-based class determination
Anindita Suryarasmi, Chin-Chun Chang, Rania Akhmalia, Maysa Marshallia, Wei-Jen Wang, Deron Liang
Topics & Concepts
Computer scienceConvolutional neural networkConvolution (computer science)Point cloudGraphicsArtificial intelligenceGraphics processing unitDeep learningNet (polyhedron)Computer engineeringPattern recognition (psychology)Embedded systemReal-time computingArtificial neural networkParallel computingComputer graphics (images)MathematicsGeometryIndustrial Vision Systems and Defect DetectionSurface Roughness and Optical MeasurementsIntegrated Circuits and Semiconductor Failure Analysis