Quality enhancement of interferometric fringe pattern based on deep-learning-based denoising of combined noise
Juncheol Bae, Y.‐M. Kim, Yusuke Ito, Naohiko Sugita, Mamoru Mitsuishi
Topics & Concepts
Noise reductionInterferometryNoise (video)Quality (philosophy)Computer scienceArtificial intelligenceMaterials scienceOpticsPhysicsImage (mathematics)Quantum mechanicsOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesOptical Systems and Laser Technology