Towards trustworthy remaining useful life prediction through multi-source information fusion and a novel LSTM-DAU model
Rui Bai, Khandaker Noman, Yu Yang, Yongbo Li, Weiguo Guo
Topics & Concepts
Computer scienceReliability (semiconductor)Key (lock)Information fusionData miningDual (grammatical number)TrustworthinessState (computer science)Reliability engineeringMachine learningArtificial intelligenceEngineeringComputer securityArtAlgorithmPhysicsLiteraturePower (physics)Quantum mechanicsMachine Fault Diagnosis TechniquesAdvanced Machining and Optimization TechniquesFault Detection and Control Systems