Assessment of Interface Trap Charges on Proposed TFET for Low Power High-Frequency Application
Sachin Kumar, Dharmendra Singh Yadav
Topics & Concepts
Ambipolar diffusionMaterials scienceTrap (plumbing)OptoelectronicsLinearityInterface (matter)DielectricOxideReliability (semiconductor)Subthreshold swingPower (physics)TransistorElectrical engineeringField-effect transistorPlasmaPhysicsEngineeringVoltageCapillary numberComposite materialMeteorologyCapillary actionMetallurgyQuantum mechanicsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignFerroelectric and Negative Capacitance Devices