Single event burnout of SiC MOSFET induced by atmospheric neutrons
Lihua Mo, Quanzhi Yu, Zhiliang Hu, Bin Zhou, Tiancheng Yi, Liubin Yuan, Li Lin, Fei Shen, Tianjiao Liang
Topics & Concepts
Materials scienceSilicon carbideNeutronOptoelectronicsWaferElectric fieldMOSFETSpallation Neutron SourceSpallationVoltageNuclear physicsComposite materialElectrical engineeringTransistorPhysicsQuantum mechanicsEngineeringRadiation Effects in ElectronicsSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis