Reliability demonstration test plan for degraded products subject to Gamma process with unit heterogeneity
Huiling Zheng, Jun Yang, Yu Zhao
Topics & Concepts
Test planReliability (semiconductor)Reliability engineeringSampling (signal processing)Constraint (computer-aided design)Mathematical optimizationPlan (archaeology)Process (computing)Computer scienceMathematicsStatisticsEngineeringPower (physics)Quantum mechanicsFilter (signal processing)ArchaeologyOperating systemWeibull distributionComputer visionPhysicsHistoryGeometryReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsRisk and Safety Analysis