Longitudinal and transverse spatial beam profile measurement of relativistic electron bunch by electro-optic sampling
Masato Ota, Koichi Kan, Soichiro Komada, Yasunobu Arikawa, Tomoki Shimizu, Valynn Katrine Mag-usara, Y. Sakawa, Tatsunosuke Matsui, Makoto Nakajima
Abstract
Abstract Electro-optic (EO) sampling is employed to measure the electric field profiles generated by a relativistic electron bunch along the propagation and in the radial directions. The longitudinal (temporal) profile is investigated by changing the time delay between the electron bunch and the pulsed probe laser, while the transverse (radial) profile is acquired by laterally shifting the path of the electron bunch. Experimental results show good agreement with three-dimensional particle-in-cell calculations. We demonstrated a promising method to simultaneously obtain the longitudinal and transverse beam sizes by utilizing the detected spatio-temporal electric field distribution around the electron bunch.