Measurement of swelling-induced residual stress in ion implanted SiC, and its effect on micromechanical properties
Alexander J. Leide, Richard I. Todd, David E.J. Armstrong
Topics & Concepts
Materials scienceNanoindentationResidual stressIrradiationSwellingHardening (computing)Composite materialRadiation damageNuclear physicsLayer (electronics)PhysicsMetal and Thin Film MechanicsAdvanced ceramic materials synthesisDiamond and Carbon-based Materials Research