Transition imaging phase measuring deflectometry for high-precision measurement of optical surfaces
Yunuo Chen, Xiangchao Zhang, Ting Chen, Rui Zhu, Lu Ye, Wei Lang
Topics & Concepts
OpticsFocus (optics)CalibrationPhase (matter)DemodulationConvolution (computer science)Computer sciencePosition (finance)Computer visionSystem of measurementDepth of fieldArtificial intelligencePhysicsTelecommunicationsQuantum mechanicsArtificial neural networkAstronomyFinanceEconomicsChannel (broadcasting)Optical measurement and interference techniquesImage Processing Techniques and ApplicationsOptical Systems and Laser Technology