Understanding metric-related pitfalls in image analysis validation

Annika Reinke, Minu D. Tizabi, Michael Baumgartner, Matthias Eisenmann, Doreen Heckmann-Nötzel, Ali Emre Kavur, Tim Rädsch, Carole H. Sudre, Laura Ación, Michela Antonelli, Tal Arbel, Spyridon Bakas, Arriel Benis, Florian Buettner, M. Jorge Cardoso, Veronika Cheplygina, Jianxu Chen, Evangelia Christodoulou, Beth A. Cimini, Keyvan Farahani, Luciana Ferrer, Adrián Galdrán, Bram van Ginneken, Ben Glocker, Patrick Godau, Daniel A. Hashimoto, Michael M. Hoffman, Merel Huisman, Fabian Isensee, Pierre Jannin, Charles E. Kahn, Dagmar Kainmueller, Bernhard Kainz, Alexandros Karargyris, Jens Kleesiek, Florian Kofler, Thijs Kooi, Annette Kopp‐Schneider, Michal Kozubek, Anna Kreshuk, Tahsin Kurç, Bennett A. Landman, Geert Litjens, Amin Madani, Klaus Maier‐Hein, Anne L. Martel, Erik Meijering, Bjoern Menze, Karel G. M. Moons, Henning Müller, Brennan Nichyporuk, Felix Nickel, Jens Petersen, Susanne M. Rafelski, Nasir Rajpoot, Mauricio Reyes, Michael A. Riegler, Nicola Rieke, Julio Sáez-Rodríguez, Clara I. Sá‎nchez, Shravya Shetty, Ronald M. Summers, Abdel Aziz Taha, Aleksei Tiulpin, Sotirios A. Tsaftaris, Ben Van Calster, Gaël Varoquaux, Ziv Yaniv, Paul F. Jäger, Lena Maier‐Hein