Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison
Tianjia Bu, Huifang Gao, Yaxuan Yao, Jianfeng Wang, Andrew J. Pollard, Elizabeth J. Legge, Charles A. Clifford, Alexandra Delvallée, S. Ducourtieux, M.A. Lawn, Bakir Babić, Victoria A. Coleman, Åsa Jämting, Shan Zou, Maohui Chen, Zygmunt J. Jakubek, Erica Iacob, Narin Chanthawong, Kittisun Mongkolsuttirat, Guanghong Zeng, Clara Muniz Almeida, Bo-Ching He, Lachlan Hyde, Lingling Ren
Abstract
Flake thickness is one of the defining properties of graphene-related 2D materials (GR2Ms), and therefore requires reliable, accurate, and reproducible measurements with well-understood uncertainties. This is needed regardless of the production method or manufacturer because it is important for all GR2M products to be globally comparable. An international interlaboratory comparison on thickness measurements of graphene oxide flakes using atomic force microscopy has been completed in technical working area 41 of versailles project on advanced materials and standards. Twelve laboratories participated in the comparison project, led by NIM, China, to improve the equivalence of thickness measurement for two-dimensional flakes. The measurement methods, uncertainty evaluation and a comparison of the results and analysis are reported in this manuscript. The data and results of this project will be directly used to support the development of an ISO standard.