A low power single bit-line configuration dependent 7T SRAM bit cell with process-variation-tolerant enhanced read performance
Bhawna Rawat, Poornima Mittal
Topics & Concepts
Process variationStatic random-access memoryVoltageComputer sciencePower (physics)Process cornersMemory cellCachePower consumptionElectronic engineeringElectrical engineeringComputer hardwareTransistorEngineeringParallel computingPhysicsQuantum mechanicsLow-power high-performance VLSI designVLSI and FPGA Design TechniquesParallel Computing and Optimization Techniques