Influence of frequency and gamma irradiation on the electrical characteristics of Er2O3, Gd2O3, Yb2O3, and HfO2 MOS-based devices
Ayşegül Kahraman, S.C. Deevi, Ercan Yılmaz
Topics & Concepts
Materials scienceDielectricIrradiationOptoelectronicsOxideCapacitorCapacitanceSemiconductorHigh-κ dielectricAnalytical Chemistry (journal)VoltageElectrical engineeringElectrodePhysicsNuclear physicsChemistryPhysical chemistryMetallurgyEngineeringChromatographySemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure AnalysisElectronic and Structural Properties of Oxides