Litcius/Paper detail

Incremental discovery of new defects: application to screwing process monitoring

Mahmoud Ferhat, Mathieu Ritou, Philippe Leray, Nicolas Du

2021CIRP Annals14 citationsDOIOpen Access PDF

Topics & Concepts

TraceabilityProcess (computing)Data miningComputer scienceKey (lock)VisualizationAutomotive industryFault detection and isolationFault (geology)Cluster (spacecraft)EngineeringArtificial intelligenceReliability engineeringSoftware engineeringActuatorProgramming languageComputer securityOperating systemAerospace engineeringGeologySeismologyIndustrial Vision Systems and Defect DetectionManufacturing Process and OptimizationFault Detection and Control Systems