Litcius/Paper detail

A Review on IGBT Module Failure Modes and Lifetime Testing

Ahmed Abuelnaga, Mehdi Narimani, Amir Sajjad Bahman

2021IEEE Access220 citationsDOIOpen Access PDF

Abstract

This article focuses on failure modes and lifetime testing of IGBT modules being one of the most vulnerable components in power electronic converters. IGBT modules have already located themselves in the heart of many critical applications, such as automotive, aerospace, transportation, and energy. They are required to work under harsh operational and environmental conditions for extended target lifetime that may reach 30 to 40 years in some applications. Therefore, addressing the reliability of IGBT modules is of paramount importance. The paper provides a comprehensive review on IGBT modules dominant failure modes, and long-term reliability. A detailed discussion on accelerated testing, and lifetime and degradation characterization considering thermo-mechanical stress is also presented in details.

Topics & Concepts

Insulated-gate bipolar transistorReliability (semiconductor)Reliability engineeringConvertersComputer sciencePower (physics)AerospaceFailure mode and effects analysisAccelerated life testingAutomotive industryAutomotive engineeringElectrical engineeringEngineeringVoltageAerospace engineeringMaturity (psychological)Developmental psychologyPhysicsQuantum mechanicsPsychologySilicon Carbide Semiconductor TechnologiesElectrostatic Discharge in ElectronicsSemiconductor materials and devices