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Simultaneous Fine-Tuning of Hirshfeld Topological Surfaces, Volumes, and their Voids to Optimize the Radiation Shielding Properties: A Case Study of Silicon Carbide (SiC)

Z. Y. Khattari

2023Silicon25 citationsDOI

Topics & Concepts

Electromagnetic shieldingMaterials scienceSilicon carbideRadiationAttenuationRadiation damageOptoelectronicsEngineering physicsSiliconMechanical engineeringNanotechnologyComposite materialOpticsPhysicsEngineeringRadiation Shielding Materials AnalysisBoron and Carbon Nanomaterials ResearchAdvanced ceramic materials synthesis
Simultaneous Fine-Tuning of Hirshfeld Topological Surfaces, Volumes, and their Voids to Optimize the Radiation Shielding Properties: A Case Study of Silicon Carbide (SiC) | Litcius