Computer vision defect detection on unseen backgrounds for manufacturing inspection
Ahmad Mohamad Mezher, Andrew E. Marble
Topics & Concepts
Computer scienceArtificial intelligenceClassifier (UML)Deep learningVisual inspectionTask (project management)Machine learningVariety (cybernetics)Object detectionParameterized complexityPattern recognition (psychology)Computer visionEngineeringAlgorithmSystems engineeringIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesIntegrated Circuits and Semiconductor Failure Analysis