Litcius/Paper detail

Rapid in-line residual stress analysis from a portable two-dimensional X-ray diffractometer

Shashwat Shukla

2020Measurement19 citationsDOI

Topics & Concepts

Residual stressOpticsDetectorResidualMaterials scienceDiffractionDiffractometerDistortion (music)PhysicsComputer scienceAlgorithmComposite materialOptoelectronicsScanning electron microscopeCMOSAmplifierWelding Techniques and Residual StressesMicrostructure and Mechanical Properties of SteelsSurface Treatment and Residual Stress